Vacuum dilution extraction gas sampling method
US5297432A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 12, 1991 |
| Grant date | Mar 29, 1994 |
| Priority date | — |
| Expiry date | Nov 12, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/244
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A gas sampling system utilizing a pair of parallel sonic orifices. One of the orifices is connected to a source of filtered, heated samples. The second, larger orifice is connected to a source of dilution gas. A vacuum pump maintains a substantial vacuum behind the orifices, thus assuring critical flow therethrough. The sample and diffusion gas are mixed behind the orifices and transported under partial vacuum for analysis. The dew point of the sample is affected by both the ratio of the diameter of orifices and the degree of vacuum transporting the gas mixture. As such, the dew point can be varied indefinitely by any reasonable combination of orifice ratio and vacuum pump strength.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.