Patent · US Expired

Method of monitoring metal ion content in plating baths

US5298131A · kind A · utility

3Cited by
1References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 28, 1993
Grant dateMar 29, 1994
Priority date
Expiry dateMay 28, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S204/08
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of monitoring in-tank and on-line metal ion content within a plating bath. The method involves the steps of applying a pretreatment signal to a sensing electrode positioned within the plating bath, applying a sweep signal to the pretreated sensing electrode, and measuring the voltammetric peak current of the resultant response signal. The voltammetric peak current is proportional to the metal ion content of the plating bath. The method complements and is easily integrated with known voltammetric techniques for analysis of trace and major constituents, and is thus an integral part of an efficient overall plating bath analysis system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.