Accelerated shadow testing method for three dimensional graphics rendering system
US5299298A · kind A · utility
34Cited by
6References
37Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 28, 1991 |
| Grant date | Mar 29, 1994 |
| Priority date | — |
| Expiry date | Feb 28, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T15/60
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Shadow testing of a two dimensional projection of a three dimensional scene is accelerated by superimposing the projection with a plurality of scan areas, then examining points, and edges of objects, falling within each scan area. Points are identified as potentially shadowed points if bracketed by edges of any object, and the bracketing object is identified as a potential shadower of the potentially shadowed points. Potential shadowers and potentially shadowed points undergo a series of tests to rapidly determine which, if any, of the potential shadowers are actual shadowers of each potentially shadowed point.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.