Thin film detector and method of manufacture
US5300807A · kind A · utility
10Cited by
3References
8Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 22, 1992 |
| Grant date | Apr 5, 1994 |
| Priority date | — |
| Expiry date | Jan 22, 2012 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The invention is related to electronic and more specifically to photo-electronic devices manufactured by means of thin film layering techniques. The invention proposes the use of polymer, copolymer, polyamide and similar organic casting materials, in layers 500 to 10,000 angstroms thick, as protective barriers between layers where the processing of one layer would be adversely affected by or would damage an adjacent previously formed layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.