Apparatus and method for spectroscopic analysis of scattering media

US5303026A · kind A · utility

Assignee

• The Regents of the University of California Los Alamos National Laboratory · US

Inventors

• Karlheinz Strobl · Mount Sinai, US
• Irving J. Bigio · Los Alamos, US
• Thomas R. Loree · Santa Fe, US

Key dates

• Filing date: Feb 12, 1992
• Grant date: Apr 12, 1994
• Expiry date: Feb 12, 2012

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2201/08
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Apparatus and method for spectroscopic analysis of scattering media. Subtle differences in materials have been found to be detectable from plots of intensity as a function of wavelength of collected emitted and scattered light versus wavelength of excitation light.