Atmospheric pressure ionization mass spectroscopy method including a silica gel drying step
US5304796A · kind A · utility
5Cited by
11References
3Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 25, 1992 |
| Grant date | Apr 19, 1994 |
| Priority date | — |
| Expiry date | Mar 25, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/0014
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a method of analyzing a gas sample for trace impurity concentration by atmospheric pressure ionization mass spectroscopy. In accordance with the present invention, moisture is removed from the gas sample before analysis by passing the gas sample through a dried bed of silica gel. The bed of silica gel is sufficiently dried so that remaining moisture present in the gas sample after passage through the bed is at a sufficiently low concentration such that the trace impurity concentration as analyzed by atmospheric ionization mass spectroscopy will not be effected by the remaining moisture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.