Method for measuring liquid scintillation samples deposited on multi-well sample plates
US5306914A · kind A · utility
1Cited by
3References
4Claims
0Family size
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Key dates
| Filing date | Sep 23, 1992 |
| Grant date | Apr 26, 1994 |
| Priority date | — |
| Expiry date | Sep 23, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/204
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A method for correcting measuring values when measuring liquid scintillation samples deposited on sample plates by a photodetector which will be affected by scintillation photons from other samples in the plate in addition to the sample being measured. Said correction is done by pre-determining affection of the other samples of the plate as a function of quench level and correcting observed measuring values using this information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.