Patent · US Expired

Method for measuring liquid scintillation samples deposited on multi-well sample plates

US5306914A · kind A · utility

1Cited by
3References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 23, 1992
Grant dateApr 26, 1994
Priority date
Expiry dateSep 23, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01T1/204
  • WIPO fieldEnvironmental technology
  • WIPO sectorChemistry

Abstract

A method for correcting measuring values when measuring liquid scintillation samples deposited on sample plates by a photodetector which will be affected by scintillation photons from other samples in the plate in addition to the sample being measured. Said correction is done by pre-determining affection of the other samples of the plate as a function of quench level and correcting observed measuring values using this information.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.