Sample chamber for a spectro photometer
US5307155A · kind A · utility
5Cited by
4References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 31, 1992 |
| Grant date | Apr 26, 1994 |
| Priority date | — |
| Expiry date | Jan 31, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/86
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectro photometer deflects a measuring beam off its original axis to pass through a long sample, and returns the measuring beam to its final direction after passing through the sample. The sample is guided along a path which is clear of a reference beam of the spectro photometer. This arrangement permits double-beam measurement of long samples, with good signal-to-noise ratio. Deflection is accomplished using a plurality of mirrors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.