Method of quantifying the topographic structure of a surface
US5307292A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 24, 1992 |
| Grant date | Apr 26, 1994 |
| Priority date | — |
| Expiry date | Jun 24, 2012 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/861
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
A fractal-based or "patchwork" method for analyzing topographic data simulates covering the surface of a specimen surface with triangular patches in order to determine the relative surface area which is a function of patch size or scale of observation or interaction. The specimen surface has X and Y horizontal axes and a vertical Z axis. Height data is obtained for each point of a grid network of points on the surface, the points being arranged in parallel rows and the rows being spaced. The specimen surface is defined with triangles having a surface area equal to a preselected patch area value. The total area of the planar triangles is calculated to obtain a total measured area of value. The area of the specimen surface in the X-Y plane that is defined by the triangles is calculated to obtain a total measured area value. The total measured area value is divided by the total projected area value to obtain a relative area value. The relative values for several patch area values are plotted to obtain a slope and a threshold, or crossover, point. The threshold is indicative of a point which separates the relatively large scales of observation or interaction which are best described by…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.