Material level probe having crimp seal
US5307678A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 7, 1993 |
| Grant date | May 3, 1994 |
| Priority date | — |
| Expiry date | Jun 7, 2013 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49117
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A level measuring probe in which all potential leakage paths are closed by concentrically shrinking the outmost diametrical surface of the probe by some mechanical means such as a crimper or rotary swager to provide sufficient force to substantially uniformly deform the ground, guard, and active elements and insulators around the circumference of the probe such that multiple seals are created. A circumferential notch is preferably provided in the active probe element at the point of the crimping or swaging to provide "blowout protection" whereby the active probe electrode is held in place when used in a high pressure vessel. A pressure seal between the electrodes and insulation material is also maintained by using an elastomeric insulator which returns to its original shape after heating or a thin electrode which "gives" a little when the insulator expands radially during heating. The arrangement of the invention thus eliminates the need for costly machined parts and bushings to provide pressure seals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.