Patent · US Expired

Semiconductor memory device

US5308781A · kind A · utility

12Cited by
1References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 13, 1993
Grant dateMay 3, 1994
Priority date
Expiry dateJan 13, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/981

Abstract

A semiconductor memory device comprising a substrate, a longitudinal source diffusion layer for a plurality of memory transistor source regions continuously formed on the substrate, and a longitudinal drain diffusion layer for a plurality of memory transistor drain regions continuously formed on the substrate in parallel to the source diffusion layer. A word line is formed crossing over the diffusion layers. And an electrically insulating film is interposed between the word line and the diffusion layers. The insulating film is thicker than a gate oxide film formed between the diffusion layers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.