Patent · US Expired

Eddy current device for inspecting a component having a flexible support with a plural sensor array

US5315234A · kind A · utility

60Cited by
7References
35Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 3, 1992
Grant dateMay 24, 1994
Priority date
Expiry dateApr 3, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/902
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An eddy current device for inspecting a component includes an eddy current array circuit having respective pluralities of drive and sense elements and having an active face for positioning on a surface of the component during the inspection operation. A backing is disposed on a face of the eddy current array circuit opposite to the active face for concentrating an electromagnetic flux from the eddy current array circuit into the component when each of the plurality of drive elements is being energized. A mechanical arrangement is provided for supporting and deploying the backing and the array circuit to substantially conform with the surface portion under inspection and to cause each of the pluralities of drive and sense elements to be maintained at their respective substantially constant distances from the inspection surface during scanning, preferably at a controlled rate of scan.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.