Method of measuring reduction of surface layer material and apparatus therefor
US5317605A · kind A · utility
1Cited by
13References
3Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 18, 1993 |
| Grant date | May 31, 1994 |
| Priority date | — |
| Expiry date | Feb 18, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/634
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method in which a surface layer material whose amount of reduction is to be measured is activated to find a distribution ratio of two or more kinds of radioactive nuclides that are produced in the space in the surface layer of the material, and the distribution ratio is used as an index for the amount of reduction of surface layer material. The amount of reduction in the surface layer material is measured in situ, nondestructively, easily and irrespectively of obstacles and the distance that exist between the detector and the material that is to be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.