Device and method for inspection of baggage and other objects
US5319547A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 10, 1990 |
| Grant date | Jun 7, 1994 |
| Priority date | — |
| Expiry date | Aug 10, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30112
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device and method is provided for finding a specific material superimposed on an unknown background when the locations of the specific material and the background are unknown, for example, inside an item of baggage. The invention comprises exposing an area of an item to be inspected to x-rays of two substanitally different energies, making effective use of the characteristic material specific differences in photoelectric effect scattering and Compton scattering, and comparing the pairwise differential attenuation of the x-rays at nearby exposed subareas to determine whether differences in attenuation can be attributed to the presence of different amounts of the specific material overlying the respective subareas. The most probable subareas are indicated on a standard image on a monitor as being the most likely location of the overlying specific material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.