Patent · US Expired

Scanning force microscope

US5319960A · kind A · utility

42Cited by
8References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 6, 1992
Grant dateJun 14, 1994
Priority date
Expiry dateMar 6, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/87
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The scanning force microscope is an improved free standing type scanning force microscope with integrated scanning drivers for examination of a wide range of sizes and weights of stationary specimens, with the capability of scanning a sample in contact with a fluid. The scanning force microscope also includes motorized driver legs for operating the approach of the optical lever arm and sensor head to the sample, to allow for automation of the approach of the sensor head to the specimen.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.