Patent · US Expired

Circuit for measuring capacitance at high DC bias voltage

US5321367A · kind A · utility

7Cited by
6References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 21, 1992
Grant dateJun 14, 1994
Priority date—
Expiry dateSep 21, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/2605
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A circuit for measuring capacitor properties under high DC bias voltage. A apacitor is subject to a high DC bias by a high voltage supply having low AC impedance. A triangle wave voltage is applied to the capacitor at the terminal opposite the high bias voltage. A current is thereby induced due to the voltage difference across the capacitor generated by the triangle wave. The induced current is measured and properties of the capacitor calculated therefrom. The measuring circuitry is isolated from the high DC bias voltage applied to the capacitor. Therefore, the biasing voltage applied to the capacitor is limited only by the breakdown voltage of the capacitor under test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.