Patent · US Expired

Cantilever type probe, scanning tunnel microscope and information processing apparatus using the same

US5321685A · kind A · utility

40Cited by
10References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 20, 1992
Grant dateJun 14, 1994
Priority date
Expiry dateNov 20, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/947
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A cantilever type probe comprising a piezoelectric bimorph cantilever containing a piezoelectric material provided between driving electrodes for driving a cantilever, a probe formed thereon and a drawing electrode for a probe provided along the surface where a probe is formed, wherein there is provided a shielding electrode for electrically isolating the probe and the drawing electrode from the driving electrodes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.