High power laser beam sampler
US5323267A · kind A · utility
7Cited by
8References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 2, 1992 |
| Grant date | Jun 21, 1994 |
| Priority date | — |
| Expiry date | Jan 2, 2012 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S3/0014
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A beam sampler comprises a substrate made of highly transparent fused silica or zinc selenide, both capable of sustaining high power laser beams. The substrate defines an outer surface through which the light beam being sampled propagates. A sinusoidal diffracting relief is etched on this outer surface directly into the light-propagating material of the substrate. When a light beam propagates through the outer surface of the substrate, the three-dimensional diffracting relief extracts from this light beam at least one pair of low power beam samples.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.