Method of forming a quartz oscillator temperature sensor
US5325574A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 27, 1993 |
| Grant date | Jul 5, 1994 |
| Priority date | — |
| Expiry date | Aug 27, 2013 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/42
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A quartz oscillator temperature sensor which measures temperature based on the change in resonance or oscillation frequency of a quartz oscillator with the change in temperature of the oscillator can be constructed by cutting a piece of quartz from a wafer with a thickness of about 80 to 150 .mu.m by rotating the plane of the crystal defined by the electrical and mechanical axes 15 to 25.degree. about the electrical axis and then forming the wafer into a quartz tuning fork. The tuning fork is housed in a case sealed with a stem and coupled to electrical leads with heat resistent solder formed with more than about 90 wt % Pb and less than 10% Sn. The area within the case should be at a substantially high vacuum.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.