Glitchless test signal generator
US5327076A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 17, 1992 |
| Grant date | Jul 5, 1994 |
| Priority date | — |
| Expiry date | Sep 17, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31917
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test signal generating system for providing test signals to electronic circuit components under test in a burn-in system, the test signal generating system having a timing arrangement for eliminating glitches from the test signals, The test signal generating system comprises a data generator, a timing generator and a format selector, each of which provides an input signal to a test signal selector, A first, second and third flip-flop are electrically connected to the data generator, timing generator and format selector, respectively. A fourth flip-flop is electrically connected to an output of the test signal selection means, Each of the flip-flops is triggered by the same clock.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.