High sensitive multi-wavelength spectral analyzer
US5329353A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 7, 1992 |
| Grant date | Jul 12, 1994 |
| Priority date | — |
| Expiry date | Feb 7, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2813
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A compact, high sensitive, multi-wavelength spectral analyzer capable of simultaneously obtaining a spectral distribution of extremely weak radiation such as bioluminescence, chemiluminescence, extremely weak fluorescence caused by excitation light, Raman scattered light, etc. with an extremely high luminosity and without wavelength scanning. The spectral analyzer comprises a spectroscope and a high sensitive one- or two-dimensional photodetector. The spectroscope includes an entrance slit, a collimator lens of high luminosity disposed such that a focal point of the collimator lens is coincident with the entrance slit to convert light emerging therefrom into parallel rays, a reflection diffraction grating that diffracts the parallel rays from the collimator lens to produce spectra, and an imaging lens that focuses the parallel rays diffracted by the reflection diffraction grating on an image plane thereof to form a spectral image. The photodetector is disposed on the image plane of the imaging lens.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.