Patent · US Expired

Non-destructive test strip and method for measuring paint film build

US5329810A · kind A · utility

2Cited by
6References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 23, 1993
Grant dateJul 19, 1994
Priority date
Expiry dateAug 23, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0298
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test strip for measuring film build on a plastic piece includes a desired length of tape having an adhesive coating on an inner surface and a window. A paint strip of sufficient area to cover the window is secured to the tape by the adhesive. A backing formed from material easily peeled from the adhesive is removed when the tape is mounted on a piece prior to painting. After painting, the test strip is peeled away from the piece so that the paint strip can be separated from the tape, analyzed and stored.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.