Patent · US Expired

Method of inspecting the dimensional accuracy of medical ampuls

US5331174A · kind A · utility

5Cited by
9References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 5, 1993
Grant dateJul 19, 1994
Priority date
Expiry dateFeb 5, 2013

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/9036
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

To automatically examine medical ampuls to determine their dimensional accuracy, the ampuls are moved in a horizontal position on a chain conveyor in a cadenced manner through an optoelectronic testing station. At the testing station, each ampul is lifted out of the chain conveyor and illuminated by light from a diffusely radiating illumination source perpendicularly to the longitudinal axis of the ampul. In the case of one-point-cut ampuls, the ampuls are rotated about their longitudinal axes during the testing process. The light passing through the ampul is received by a photodiode camera system which converts the images into electrical image signals. These image signals are evaluated with respect to their changes in intensity produced by the tested ampul in order to generate measurement values for the desired ampul dimensions and, if applicable, for their deviations from standard ampul dimensions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.