Patent · US Expired

Semiconductor device including nonvolatile memories

US5331190A · kind A · utility

3Cited by
1References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 18, 1992
Grant dateJul 19, 1994
Priority date
Expiry dateDec 18, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/14
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention provides nonvolatile semiconductor memory which has advantages permitting the cell of the memory circuit to integrate, the memory circuit to be easy to manufacture, and the manufacturing expense to be cut down. The nonvolatile memory (21) comprises a P type well for which a N+ type source (4) and a N+ type drain (3) is provided. A surface of a space between the source (4) and the drain (3) comprises a first portion (10a) and a second portion (10b). An insulating layer (6) for holding electrons spans the surface of the space. A memory gate electrode (5) is on the insulating layer (6) and spans the first portion (10a). The surface of the second portion (10b) and a part of the surface of the memory gate electrode (5) is covered with a first region electrode (24) attaching to the source (4). But the first region electrode (24) is insulated from the memory gate electrode (5) with the insulating layer (8).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.