Technique for determining the amplified spontaneous emission noise of an optical circuit in the presence of an optical signal
US5340979A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 1992 |
| Grant date | Aug 23, 1994 |
| Priority date | — |
| Expiry date | Sep 25, 2012 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S2301/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining the amplified spontaneous emission noise of an optical circuit, such as an optical amplifier, in the presence of an optical signal includes applying a pulsed optical signal of prescribed intensity to an input of an optical circuit under test, and detecting an output signal from the optical circuit slightly after the pulsed optical signal is switched from on to off. The output signal immediately after the optical signal is switched off represents the amplified spontaneous emission noise of the optical circuit in the presence of an optical signal of the prescribed intensity. In a first embodiment, an optical spectrum analyzer is used for detecting the output signal. In a second embodiment, the output signal is passed through a narrow band optical filter to a photodetector. An electrical spectrum analyzer displays the detected waveform. When necessary, the observed output signal is extrapolated to a time immediately after the optical signal is switched off.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.