Method for production of standard oxide sample for X-ray fluorescence spectrometry
US5344779A · kind A · utility
2Cited by
7References
6Claims
0Family size
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Key dates
| Filing date | Mar 22, 1993 |
| Grant date | Sep 6, 1994 |
| Priority date | — |
| Expiry date | Mar 22, 2013 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/109163
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for the production of a standard oxide sample for X-ray fluorescence analysis of an impurity element contained in an inorganic compound. The standard oxide sample is produced by accurately weighing a high-purity compound of the type of the main-component element of the inorganic compound, dissolving the weighed compound in an acid, adding an element of the type of the impurity element to be subjected to determination in a prescribed amount to the acid solution, evaporating the resultant solution to dryness, and heating the dry residue of evaporation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.