Method and apparatus for measuring spectral absorption in an opaque specimen and method and apparatus for measuring the microscopic absorption distribution
US5345306A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | May 22, 1991 |
| Grant date | Sep 6, 1994 |
| Priority date | — |
| Expiry date | May 22, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4709
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In the method of and apparatus for measuring a spectral absorption in an opaque specimen, a scattering specimen is illuminated with highly directional light of variable wavelength from a specific direction, thereby removing scattered rays as much as possible, and thus detecting the intensity of only parallel rays of a component transmitted or reflected in a specific direction (i.e., rectilinear component rays) by use of a highly directional detecting system, for example, a heterodyne light-receiving system, Michelson light-receiving system, highly directional optical system, etc. It is therefore possible to measure spectral absorption characteristics of a scattering specimen with high accuracy without picking up scattered light in other undesired directions nor other noise light. In addition, the measurement of the control is exceedingly simplified in comparison to the conventional method and thus the measurement is extremely facilitated. Thus, the method and apparatus of the present invention are suitable for measuring spectral absorption of a component transmitted or reflected in a specific direction in not only sparse heterogeneous systems having spatial resolving power, for exa…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.