Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide
US5349431A · kind A · utility
0Cited by
2References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 30, 1993 |
| Grant date | Sep 20, 1994 |
| Priority date | — |
| Expiry date | Jun 30, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/412
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical waveguide portion is provided on one surface of a substrate portion. A luminous flux for measurement is caused to be incident on one end face of the optical waveguide substrate, and only leaking light having passed through the substrate portion is received. The cross-sectional distribution of the refractive index of the optical waveguide portion is measured from changes in the received quantity of light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.