Patent · US Expired

Opto-electronic measuring device with optical air wedge spectral analysis arrangement

US5349439A · kind A · utility

24Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 31, 1992
Grant dateSep 20, 1994
Priority date
Expiry dateMar 31, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D5/266
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measuring device comprises a light source with a wide spectrum feeding an optical sensor through an optical fiber. The sensor comprises an interferometer adjusted to a dull tint and an optical component sensitive to a measured parameter, which may be either a pressure, a measured displacement or an index of refraction of a fluid, a readout device includes the photodetector, a processing unit and an optical wedge for producing fringes, whose lateral positions, in contrast, are representative of the spectrum of the flux leaving the interferometer and analyzed by the photodetector. The processing unit measures the lateral position of the fringe and converts it into a value of the parameter P.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.