Patent · US Expired

Method and apparatus for detecting stress in an object

US5349870A · kind A · utility

6Cited by
2References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 21, 1992
Grant dateSep 27, 1994
Priority date
Expiry dateFeb 21, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L1/248
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Apparatus for measuring stress at a point on an object comprising: means for applying a cyclically varying load of period T to the object; detector means for collecting and measuring thermal radiation from said point over a sample time interval t, wherein t<T; means for determining the phase of the first interval t with respect to the cyclic variation of thermal radiation produced by said point in response to said applied load and, from said collected and measured value of thermal radiation and said phase, for providing a measure of stress at said point.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.