Microwave component test method and apparatus
US5351001A · kind A · utility
25Cited by
18References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 5, 1990 |
| Grant date | Sep 27, 1994 |
| Priority date | — |
| Expiry date | Apr 5, 2010 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/3011
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A test fixture for testing microwave components enables components to be tested with high correlation between the component's test results and its operation in a system. The test fixture provides for non-destructive mounting of and connection of the component to the test fixture in the same manner as it will be connected in the final system and also provides for tailoring of the test connections as may be desired.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.