Patent · US Expired

Test probe

US5351002A · kind A · utility

2Cited by

23References

12Claims

0Family size

Assignee

Snap-on Incorporated · US

Inventors

Gary S. Wollert · Bristol, US
Timothy J. Alho · Pleasant Prairie, US
Robert D. Braun · Kenosha, US

Key dates

Filing date	Aug 20, 1990
Grant date	Sep 27, 1994
Priority date	—
Expiry date	Aug 20, 2010

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06788
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The test probe comprises a handle and a rod, the rod including a flat face which can be placed against an electrical terminal to be tested. The rod includes a loop residing in a cavity in the handle. An alligator clip may be applied to the loop.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.