Measuring apparatus using an ultrasonic wave to provide flaking state detection for a specimen on the basis of freqency analysis of a wave reflected by the specimen
US5351544A · kind A · utility
19Cited by
7References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 18, 1991 |
| Grant date | Oct 4, 1994 |
| Priority date | — |
| Expiry date | Nov 18, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2697
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring apparatus using an ultrasonic wave according to the invention transmits an ultrasonic wave pulse into a specimen, receives the echo reflected by the specimen and converts it into an electric signal. The components of the electric signal that represent the wave reflected by the specimen and contain data on the state of the specimen are extracted by a gate circuit. The components obtained by the gate circuit are converted into a power spectrum by a circuit for performing a Fourier transformation. The thickness of the specimen and/or the flaking state of the specimen can be determined from this power spectrum.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.