Patent · US Expired

Programmable semiconductor antifuse structure and method of fabricating

US5353246A · kind A · utility

40Cited by
14References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 18, 1993
Grant dateOct 4, 1994
Priority date
Expiry dateAug 18, 2013

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D48/381
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A programmable semiconductor antifuse structure and method of fabricating are provided which allow for miniaturization of components to an area of less than one micron. The cell exhibits a high pre-programmed resistance of more than 1.times.10.sup.7 ohms and has an extremely low programmed cell resistance of around 50 ohms.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.