Examination of subjects using photon migration with high directionality techniques
US5353799A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 17, 1992 |
| Grant date | Oct 11, 1994 |
| Priority date | — |
| Expiry date | Jun 17, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0696
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for examination of a subject positioned between input and detection ports of the spectroscopic system applied to the subject. The systems shown include at least one light source for introducing at one or multiple input ports, electromagnetic non-ionizing radiation of a known time-varying pattern of photon density of a wavelength selected to be scattered and absorbed while migrating in the subject, radiation pattern control means for achieving a directional pattern of emitted resulting radiation that possesses substantial gradient of photon density, at least one detector for detecting the radiation that has migrated in the subject at one or multiple detection ports. The systems also include processing means for processing the detected radiation and creating sets of data, and evaluation means for examining the subject using the data sets. The emitted directional radiation pattern utilizes its gradient of photon density to detect a hidden object while scanning across the examined subject. The wavelength of the radiation can be selected to be sensitive to endogenous or exogenous pigments, or to cause fluorescent emission from a fluorescent constituent of interest in…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.