Method and apparatus for measuring the temperature of an electrically conductive material
US5354130A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 30, 1992 |
| Grant date | Oct 11, 1994 |
| Priority date | — |
| Expiry date | Jul 30, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/36
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention concerns a method and an apparatus for measuring the temperature of an electrically conductive material, said method being based on the measurement of the thermal noise of the material. In the method, the fluctuation of the magnetic field generated by the random motion of the charge carriers in the conductive material is measured using a resonant circuit (3) without contact with the material (1) under measurement. The apparatus comprises a sensor (5) provided with a resonant circuit (3), the reactance element of which is placed at a distance (s) from the material (1) whose temperature is to be measured, and a preamplifier (2), said sensor (5) being mounted inside a frame (20) made of a conductive material, such as copper.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.