Method for increased sensitivity of radiation detection and measurement
US5354997A · kind A · utility
28Cited by
1References
20Claims
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Key dates
| Filing date | Mar 18, 1993 |
| Grant date | Oct 11, 1994 |
| Priority date | — |
| Expiry date | Mar 18, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/10
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
Dose of radiation to which a body of crystalline material has been exposed is measured by exposing the body to optical radiation at a first wavelength, which is greater than about 540 nm, and measuring optical energy emitted from the body by luminescence at a second wavelength, which is longer than the first wavelength. Reduced background is accomplished by more thorough annealing and enhanced radiation induced luminescence is obtained by treating the crystalline material to coalesce primary damage centers into secondary damage centers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.