Scanning laser microscope
US5355252A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 26, 1993 |
| Grant date | Oct 11, 1994 |
| Priority date | — |
| Expiry date | Jan 26, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/002
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A scanning laser microscope capable of detecting a fine structure producing low contrast and easily measuring the length, the volume, and so forth of an object. A laser beam is focused onto the object. The beam is scanned at regular intervals, or in a digital fashion, in two dimensions. Light scattered from the object is detected by a detector to observe an image of the object. The output signal from the detector is digitized into a given number of gray levels in synchronism with the digital scans. The object image can be stored in a memory and processed while correlating the scanned position with the intensity of the scattered light at this position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.