Method for spectroscopy using two Fabry-Perot interference filters
US5357340A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 10, 1992 |
| Grant date | Oct 18, 1994 |
| Priority date | — |
| Expiry date | Mar 10, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/262
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a process for Fabry-Perot spectroscopy using a spectrometer in the radiation path of which there is a radiation source, two successive Fabry-Perot interference filters through which the radiation passes, a blend of substances to be examined and a detector. The optical layer thickness of the first Fabry-Perot filter F1 is set to a given value and the optical layer thickness of the second Fabry-Perot filter F2 is modulated. The resultant interferogram as a function of the layer thickness is characteristic of the substance to be examined. The interferogram received at the detector D is converted by a mathematically transformation into a spectrum as a function of wave numbers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.