Integrated circuit device test socket
US5360348A · kind A · utility
39Cited by
3References
6Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 16, 1993 |
| Grant date | Nov 1, 1994 |
| Priority date | — |
| Expiry date | Aug 16, 2013 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K7/1023
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test socket for testing of semiconductor devices. The socket includes a plurality of electrical contacts mounted within a housing, a cover, and a pressure applicator which serve to prolong test life of the contacts. The pressure applicator is mounted to the cover by use of an elastomeric element which compliantly holds the applicator to the cover. The socket construction, thereby, serves to prevent damage to leads of an integrated circuit device held by the socket.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.