Patent · US Expired

Method and apparatus for examining coins

US5361886A · kind A · utility

1Cited by

3References

15Claims

0Family size

Assignee

ACT Gesellschaft fuer Soft- und Hardware-systeme GmbH · DE

Inventors

Hartmut Thomas · Munich, DE
Jens Hertlein · Berlin, DE
Eckhardt Seher · Berlin, DE

Key dates

Filing date	Mar 25, 1992
Grant date	Nov 8, 1994
Priority date	—
Expiry date	Mar 25, 2012

Classification

Technology area (CPC G)Physics
CPC primaryG07D5/10
WIPO fieldControl
WIPO sectorInstruments

Abstract

In a method and an apparatus for examining the genuineness and the value of coins using inductive and opto-electronic devices, the coin diameter, the minting and the nature of the material are determined and evaluated within a test cycle, in which the coin is taken up, centered, clamped and turned through 360.degree.. The coin diameter is ascertained and checked by way of the angle of twist between two disks, which are disposed so that they can be twisted relatively to one another. The apparatus ensures an accurately centered and vibrationless clamping of the coin for an opto-electronic scanning and the inductive identification of the material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.