Sample analyzing instrument using first and second plasma torches
US5367163A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 14, 1993 |
| Grant date | Nov 22, 1994 |
| Priority date | — |
| Expiry date | Dec 14, 2013 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/105
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An analytical instrument using a plasma is disclosed. The instrument includes two plasma torches, a first torch of which is used for vaporizing a sample and a second plasma torch is used for exciting the sample. When the analytical instrument is a mass spectrometer, the sample vaporized by the first plasma torch is introduced into the second plasma torch where the sample is ionized. The sample is then mass analyzed. If the sample is a small solid sample, it is momentarily vaporized by the plasma flame generated from the first plasma torch. If the sample is a large solid sample, it can be gradually vaporized from its surface. Therefore, the sample can be analyzed without requiring any pretreatment, e.g., dissolving the sample in an acid.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.