Noncontact position measurement systems using optical sensors
US5367373A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 19, 1992 |
| Grant date | Nov 22, 1994 |
| Priority date | — |
| Expiry date | Nov 19, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/88
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Optical and computational components are combined to form high precision, six degree-of-freedom, single-sided, noncontact position measurement systems. Reflective optical targets are provided on a target object whose position is to be sensed. Light beams are directed toward the optical targets, producing reflected beams. Electrical signals are produced by movements of reflected beams across position-sensitive detectors, such as lateral-effect photodiodes. The signals are transformed to provide measurements of translation along and rotation around three nonparallel axes which define the space in which the target object moves.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.