Patent · US Expired

Noncontact position measurement systems using optical sensors

US5367373A · kind A · utility

31Cited by
6References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 19, 1992
Grant dateNov 22, 1994
Priority date
Expiry dateNov 19, 2012

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S17/88
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Optical and computational components are combined to form high precision, six degree-of-freedom, single-sided, noncontact position measurement systems. Reflective optical targets are provided on a target object whose position is to be sensed. Light beams are directed toward the optical targets, producing reflected beams. Electrical signals are produced by movements of reflected beams across position-sensitive detectors, such as lateral-effect photodiodes. The signals are transformed to provide measurements of translation along and rotation around three nonparallel axes which define the space in which the target object moves.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.