Patent · US Expired

Device for determining material parameters by means of microwave measurements

US5369368A · kind A · utility

83Cited by

7References

13Claims

0Family size

Assignee

Laboratorium Prof. Dr. Rudolf Berthold GmbH & Co. · DE

Inventors

Rudiger Kassen · Greding, DE
Albert Klein
Jean-Marie Weber · Kaiserslautern, DE

Key dates

Filing date	Apr 2, 1993
Grant date	Nov 29, 1994
Priority date	—
Expiry date	Apr 2, 2013

Classification

Technology area (CPC G)Physics
CPC primaryG01N22/04
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A device for determining the material parameters, in particular the water content, of a substance in a dielectric medium conducted through a pipeline, the device including a waveguide of a microwave system at least partially enclosing the pipeline. Transmission or reflection of microwave radiation in the waveguide is evaluated continuously or in cycles. Continuous measurement of such media, in particular liquid media, can be effected and in particular can be made automatically without requiring steps for sample taking and performance of the measuring process per se.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.