Optical scan apparatus having jitter amount measuring means
US5371608A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 8, 1993 |
| Grant date | Dec 6, 1994 |
| Priority date | — |
| Expiry date | Apr 8, 2013 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2201/04798
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A scan optical apparatus is provided with a first light source for generating a beam for scan optically modulated based on an image signal, a second light source for generating a beam for jitter amount detection, a scanning device for deflecting the beams from the first light source and from the second light source to scan a surface to be scanned, an optical member disposed in the vicinity of the surface to be scanned or at a position substantially optically equivalent to the surface to be scanned, and a detecting device for detecting a beam reflected by the optical member and deflected by the scanning device. The optical member may have reflective portions and nonreflective portions which are repeatedly arranged in a main scan direction, or may be a corner cube array in which a plurality of corner cubes are arranged in the main scan direction. Further, the surface to be scanned may be a recording medium in a recording apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.