Patent · US Expired

Method for producing fine structure for electronic device

US5372675A · kind A · utility

21Cited by
4References
35Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 20, 1993
Grant dateDec 13, 1994
Priority date
Expiry dateAug 20, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/82
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a method for producing a fine semiconductor structure, a first layer is formed on a second layer, an etching-resistant mask is formed on the first layer, the second layer is etched in an etchant to form a desired shape thereof, a composition of the first layer is different from a composition of the second layer, and at least one of boundary surfaces of the etching-resistant mask and the first layer facing to each other is substantially prevented from including another substance which is different from both of the etching-resistant mask and the first layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.