Patent · US Expired

Process for the production of thin semiconductor material films

US5374564A · kind A · utility

1,224Cited by
3References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 15, 1992
Grant dateDec 20, 1994
Priority date
Expiry dateSep 15, 2012

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/012
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Process for the preparation of thin moncrystalline or polycrystalline semiconductor material films, characterized in that it comprises subjecting a semiconductor material wafer having a planar face to the three following stages: a first stage of implantation by bombardment (2) of the face (4) of the said wafer (1) by means of ions creating in the volume of said wafer a layer (3) of gaseous microbubbles defining in the volume of said wafer a lower region (6) constituting the mass of the substrate and an upper region (5) constituting the thin film, a second stage of intimately contacting the planar face (4) of said wafer with a stiffener (7) constituted by at least one rigid material layer, a third stage of heat treating the assembly of said wafer (1) and said stiffener (7) at a temperature above that at which the ion bombardment (2) was carried out and sufficient to create by a crystalline rearrangement effect in said wafer (1) and a pressure effect in the said microbubbles, a separation between the thin film (5 ) and the mass of the substrate (6).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.