Method for testing active matrix liquid crystal by measuring voltage due to charge in a supplemental capacitor
US5377030A · kind A · utility
49Cited by
9References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 26, 1993 |
| Grant date | Dec 27, 1994 |
| Priority date | — |
| Expiry date | Mar 26, 2013 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/136213
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for manufacturing an active matrix array substrate having a plurality of pixel drive cells, each pixel drive cell includes a pixel switching element and a capacitor element connected to the pixel switching element in series. The method comprising the inspection steps of storing a charge in the capacitor element and detecting the charge stored in the capacitor element by measuring the voltage and comparing the voltage measured with a reference voltage obtained with a good pixel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.