Apparatus and method for obtaining a list of numbers of wafers for integrated circuit testing
US5381344A · kind A · utility
7Cited by
10References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 6, 1992 |
| Grant date | Jan 10, 1995 |
| Priority date | — |
| Expiry date | Apr 6, 2012 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention is a method for enabling a user to enter wafer numbers into a computer-based integrated circuit production test system. The method comprises the steps of: (a) prompting the user for the wafer numbers; (b) displaying the wafer numbers in a graphical representation of a wafer cassette; (c) enabling the user to edit the wafer numbers on the graphical representation; and (d) transmitting the wafer numbers to the computer-based IC production test system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.