Patent · US Expired

Semiconductor device and method of fabricating same, as well as lead frame used therein and method of fabricating same

US5382546A · kind A · utility

13Cited by
8References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 10, 1993
Grant dateJan 17, 1995
Priority date
Expiry dateNov 10, 2013

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49121
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a semiconductor device having a number of pins, there is used an inner lead group comprising a group of upper inner leads 7A present in an upper plane and a group of lower inner leads 7B in a lower plane, the upper inner lead group and the lower inner lead group being laminated together in an insulated from each other through an insulating layer 2C, both end portions in the circumferential direction of each upper inner lead 7A being overlapped with circumferential ends of adjacent lower inner leads 7B, 7B located on both sides of the upper inner lead, and bonding areas 8A of the upper inner leads 7A being positioned radially outwards with respect to bonding areas 8B of the lower inner leads 7B, whereby the pitch between inner leads can be reduced to half, and the number of pins can be increased under the condition that the size of a resin sealing body 24 is fixed. Further, wire bonding can be done properly because a reaction force induced at the time of wire bonding for the upper inner leads 7A is borne at the overlapped portions of the lower inner leads 7B, 7B.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.